IC Testing of the Trigger Data Serializer for the ATLAS Detector
KI Wing Hung
This project is to design and execute the testing procedure of an integrated circuit (IC) in 400-pin BGA (ball grid array) package. The IC is a 4.8Gbps trigger data serializer (TDS) designed by U. of Michigan for the ATLAS (A Toroidal LHC ApparatuS) detector of the Large Hadron Collider (LHC) at CERN (European Organization for Nuclear Research). Thermal testing and radiation testing have to be performed.
The applicant has to study the TDS specifications and design the testing procedures. He/she will design the measurement procedure and work out the testing board for the IC, and then perform thermal testing and radiation testing and document the measurement procedure and measurement results. He/she may need to stay in U. of Michigan for one month (during the summer break) to learn and discuss testing procedure with the IC designers. The task may extend beyond summer 2017.
Applicant's Learning Objectives:
(1) Learn how to design test setups for thermal testing and radiation testing.
(2) Learn how to use the equipment for thermal testing and radiation testing.
(3) Learn how to carry out the testing of an industrial grade integrated circuit.